Model 3305 | |
Main Function | Transformer Scanning Test + LCR METER |
Test Parameter |
|
Transformer Scanning Turn Ratio, Phase, Turn, L, Q, Leakage L, Balance, ACR, Cp, DCR, Pin Short | |
LCR METER -- L, C, R, |Z|, Y, DCR, Q, D, R, X, | |
Test Signals Information | |
Test Level Turn 10mV ~ 10V, 10% 10mV/step | |
Others 10mV ~ 2V, 10% 10mV/step | |
Test Frequency 20Hz~1MHz, 0.002%, Resolution: 0.01 Hz | |
Output Impedance Turn 10 , when level 2V / 50 , when level<2V | |
Others Constant = OFF : Varies as range resistors | |
Constant = 320X : 100Ω ±5% | |
Constant = 107X : 25Ω ±5% | |
Constant = 106X : 10Ω ±5% | |
Measurement Range | |
L, LK : 0.00001uH ~ 9999.99H | |
C : 0.00001pF ~ 999.999mF | |
Q, D: 0.00001 ~ 99999 | |
Z, X, R: 0.00001 ~ 99.9999M | |
Y : 0.01nS ~ 99.9999S | |
θ: -90.00° ~ +90.00° | |
DCR: 0.001mΩ ~ 99.999M | |
Turn : 0.01 ~ 99999.99 turns (Secondary voltage less than 100 Vrms) | |
Pin-Short : 11 pairs, between pin to pin | |
Basic Accuracy | |
L, LK, C, Z, X, Y, R, DCR 0.1%(1kHz if AC parameter) | |
Q, D 0.0005(1kHz) | |
0.03 (1kHz) | |
Turn 0.5% (1kHz) | |
Measurement Speed (Fastest) | |
L, LK, C, Z, X, Y, R, Q, D, 80meas./sec. | |
DCR 50meas./sec. | |
Turn 10meas./sec. | |
Judge | |
Transformer Scanning PASS/FAIL judge of all test parameters output from optional HANDLER interface | |
LCR METER -- 10 bins for sorting & bin sum count output from | |
HANDLER interface/PASS/FAIL judge output from HANDLER interface | |
Trigger Internal, Manual, External | |
Display 320x240 dot-matrix LCD display | |
Equivalent Circuit Mode Series, Parallel | |
Correction Function Open/Short Zeroing, Load correction | |
Memory 15 instrument setups, expansion is possible via memory card | |
General | |
Operation Environment Temperature: 10°C ~ 40°C, Humidity: 10% ~ 90% RH | |
Power consumption 140VA max | |
Dimension(H*W*D) 177*430*300mm | |
Weight about 9.2kg | |

